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NIDays 2008 Sessions: Test, Data Aquisition and Instrumentation




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Introduction to LabVIEW FPGA for Test Applications
From design validation to automated test equipment, all test systems benefit from the low-level I/O control and parallelism that FPGA hardware provides. Using FPGA chips as the primary interface to a device under test adds high-speed intelligence to your I/O and this session will show how to use LabVIEW FPGA in high-performance test systems.
11:15 - 12:15pm Main Lecture Theatre (Ground Floor)

Using Hardware-in-the-Loop Simulation as Part of Your Test System
Hardware-in-the-Loop (HIL) simulation allows the engineer to begin testing their control units earlier in the development process and with greater test coverage compared to physical testing alone. We will show how HIL simulation is being used in different industries and present a general architecture for building your own HIL simulator.
1:15 - 2:15pm Main Lecture Theatre (Ground Floor)

Techniques for Architecting Hybrid Test Systems
A common test system management challenge is adding new technologies while balancing longevity and scalability. Learn how to optimize your system by incorporating multiple buses to form a hybrid multi-platform system. See how a well-defined modular hardware and software architecture will allow you to upgrade your system components as needed while maximizing your investment.
2:15 - 3:15pm Main Lecture Theatre (Ground Floor)

Optimising Automated Test Systems with Parallel Technologies
Learn how to use parallel technologies such as multi-core processors, pipelining and auto-scheduling to optimize the execution of your automated test system. See how to take advantage of multi-core processors to optimize processor intensive tasks while using auto-scheduling to increase the performance of instrumentation intensive tests. And also discuss new and latest features of Teststand 4.1
3:30 - 4:30pm Main Lecture Theatre (Ground Floor)

Simple. Secure. WiFi Data Acquisition
Wireless technology offers the prospect of new portable and distributed measurement applications, where cabling has previously been impractical. Yet several obstacles have hindered the broad adoption of wireless in DAQ applications, including security, reliability and integration with existing wired systems. Learn how to overcome these challenges with LabVIEW and new technology from NI.
11:15 - 12:15pm Faraday Room (Ground Floor)

Technologies and Tools for Military and Aerospace Applications
This presentation covers key technologies and tools for the Military and Aerospace industries, including multicore, high-speed digital, FPGA, PXI/PXI Express, test management software and requirements gathering. Learn how NI is extending the role of virtual instrumentation beyond the development of test systems and software-defined hardware to encompass system design, characterisation and embedded system design.
3:30 - 4:30pm Faraday Room (Ground Floor)

Additional Recommended Sessions:
Hands-on: Introduction to LabVIEW and Data Acquisition with CompactDAQ
10.15 - 11.15am Thompson Room (Second Floor)
3:30 - 4:30 pm Thompson Room (Second Floor)

Hands-on: Build an Automated Test system with PXI and Modular Instruments
10:15 - 12:15pm Moutnbatten Room (Second Floor)


Software Development Techniques Track
Test, Data Acquisition and Instrumentation Track
Industrial Control and Embedded Design Track
Hands-On Track
RF and Wireless Communications Summit Track
LabVIEW in the Curriculum Academic Summit