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Letter of Volatility for C-Series Modules

Hardware: CompactDAQ

Problem:
I need official confirmation that sensitive data passing through National Instruments C-Series modules will be erased when the device loses power.

Solution:
Here is a list of the current information on some of our C-Series modules. The list below contains the types of memory in each device, the amount, and whether or not the information stored in that memory is retained. Volatile memory loses its contents when the device is powered off while nonvolatile memory retains its contents when the device is powered off.

NI 9229

Storage Type	Size	Volatility	Access Restrictions
CPLD	2 x 256 Macrocell	Nonvolatile	Hardware controlled. Not user-accessible.
Calibration EEPROM	1k x 8-bit	Nonvolatile	The device configuration area is not accessible from any API. The section that stores calibration constants and digital power-up states does have portions that are user-accessible.

Related Links:
Knowledge Base 3CPA3SHS: Letter of Volatility for E-Series DAQ Devices
Knowledge Base 3WBH6BE1:Letter of Volatility for M-Series DAQ Devices
Knowledge Base 4GHLANQE: Clearing the User-Accessible EEPROM on an NI-DAQmx Supported Device

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Report Date: 03/19/2008
Last Updated: 04/21/2008
Document ID: 4JIICGN9

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